Aehr Test Systems announced it has received an order from a new customer for a FOX-NP Test and Burn-in System and DiePak Carrier as the first step in its commitment to utilize Aehr’s FOX-P TM Platform for qualification and production burn-in of their new family of integrated silicon photonics chips. This new customer will begin initial production test and burn-in using Aehr’s new low cost, small footprint entry-level FOX-NP system for initial product development, qualification and production, and then plans to transition to high volume production test and burn-in of 100% of their silicon photonics chips using Aehr’s FOX-XPTM multi-wafer and singulated die/module test solution. The order includes a custom DiePak® carrier for performing both electrical and optical tests per integrated die at 512 singulated die per DiePak carrier, enabling test and burn-in of over 1000 singulated die devices in parallel with the FOX-NP system and over 4,600 devices in parallel with the FOX-XP system.