Aehr Test Systems announced it has received an initial customer order for a FOX-NP?? wafer level test and burn-in system, multiple WaferPak?? Contactors, and a FOX WaferPak Aligner to be used for engineering, qualification, and small lot production wafer level test and Burn-in of their silicon carbide devices.

The customer is multiple billion dollar per year global semiconductor company with locations across Europe, Asia, and the Americas that serves various industries including automotive, industrial, mobile, and consumer applications. The FOX-NP system, including the FOX WaferPak Aligners and initial WaferPaks, are scheduled to ship over the next few months. The FOX-NP system is configured with the new Bipolar Voltage Channel Module (BVCM) and Very High Voltage Channel Module (VHVCM) options that enable new advanced test and burn-in capabilities for silicon carbide power semiconductors using Aehr's proprietary Wafer Contactors.