Cascade Microtech's third annual users' conference is just around the corner! This year, COMPASS will be held in Boston, September 15th through the 16th at the Omni Parker House, with a welcome reception the evening of the 14th. The nation's leading innovators will join together with our industry leaders and subject matter experts to share insights into their own experiences, as well as present tips and techniques to improve test and measurement.

We are working diligently to bring you a memorable event. As we are fast approaching our users' conference, we like to share with you this year's keynote and featured speakers. This year's keynote session is "The Future of Power Electronics and the Impending Challenges to Metrology", by Thomas Neyer, Fellow, High-Voltage Device & Technology Development, Fairchild Semiconductor. Dr. James Lloyd, Senior Research Scientist & Professor, SUNY/CNSE, will present the featured session, "The Importance of Understanding Reliability in Today's Unforgiving Environment".

Check out our program to learn more about our great line-up of speakers. In the meantime, here are some highlights:

  • Using On-Wafer High-Current Probing for the Design and Characterization of Next-Generation IGBT Current Sensors (Mehrdad Baghaie, Manager, Power Solution Center, Fairchild Semiconductor International, Inc.)
  • Measurement Uncertainty for THz On-Wafer Probing (Scott Barker, CEO, Dominion MicroProbes, Inc.)
  • Influence of Calibration Techniques on Device Extraction at Cryogenic Temperatures (Joseph Bardin, Professor, and Ahmet Hakan Coskun, Research Assistant /Ph.D. Student, University of Massachusetts Amherst)
  • Why is Device Test and Cleaning Such a Challenge? Fundamentals, Techniques and New Ideas (Jerry Broz, Vice President of Applications, International Test Solutions)
  • Motorized DC Positioner Control Automation Over Temperature (Koby Duckworth, Sr. Product Support Specialist, Center of Expertise, Cascade Microtech, Inc.)
  • How to Automate THz Calibrations and Verification Compared to Manual Methods (Gavin Fisher, Senior Application Engineer, Center of Expertise, Cascade Microtech, Inc.)
  • Increased Throughput Means More Data (Darnell Lane, Electronics Engineer, Northrop Grumman Corporation)
  • Customized Probe Card for On-wafer Testing of AlGaN/GaN Power Transistors (Nicolὸ Ronchi, Researcher, Power and Mixed Signal Technologies Group (PMST), imec)
  • Overcoming On-wafer Measurement Challenges with Advanced Load-Pull Techniques (Gary Simpson, CTO, Maury Microwave Corporation)
  • Simplifying Instrumentation and Prober Configuration for On-Wafer Power Device Characterization (Lee Stauffer, Senior Staff Technologist, Semiconductor Measurements Group, Keithley Instruments, Inc.)
  • Develop a Procedure to Apply the TEL P8XL SACC Docking Procedure to RADAR Products Running at Greater than 40 GHz (Jory Twitchell, Hardware Engineer, Probe, Freescale Semiconductor, Inc.)
  • New Techniques for Characterizing Switching and Driving Loss in Wide-Bandgap Power Devices (Alan Wadsworth, Market Development Manager, Keysight Technologies)

You can download the full program agenda here (PDF). If you haven't yet registered, there's still time. We hope to see you next month in Boston!

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